Scanning Electron Microscope (SEM)
The SEM-EDX is a microscopic analysis technique that uses a Field Emission Gun (FEG) which produces very high-resolution images of the surface of a sample (theoretical resolution of 1 nm). This microscopic analysis tool is particularly powerful and efficient for rapid diagnosis (pollution, inclusion...) or more complex expertise. It is equipped with an EDX (Energy Dispersive X-ray) detector which is used for semi-quantitative analysis and elementary mapping to observe the distribution of the elements present.
Materia Nova has a latest generation electron microscope equipped with:
- a conventional secondary electron detector to observe the relief of the sample.
- a backscattered electron detector to detect phases of different compositions.
- an Inlens detector to obtain high-resolution images at low voltage (1.3nm resolution at 1kV), in topography or composition.
- a transmitted electron detector for transmission images (STEM).
- an EDX detector to carry out elemental composition analysis.
