Physicochemical analysis & Spectroscopic
ICP-OES OPTICAL SPECTROMETER
TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)
Contact angle measurement Surface tension analysis
FTIR
TRIBOLAB (BRUKER)
Bruker Senterra micro-Raman spectrometer
X-RAY DIFFRACTION (XRD)
Micro Spectrometer FTIR
Scanning Electron Microscope (SEM)
X-ray photoelectron spectroscopy (XPS)